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Published education catalogue

Scanning Probe Microscopy

Education information from the published source. The education record and its time-bound offerings are kept separate.

Education facts

Code: FYAD07

The course treats modern scanning probe microscopy (SPM) techniques, primarily scanning tunneling microscopy (STM) and scanning force microscopy (SFM), both regarding theory and practice. The physical foundation and theory of STM and SFM is treated thoroughly, as well as the basic measurement modes. The course also covers advanced measurement and analysis methods, artifacts, as well as manipulation with STM and SFM. Several examples of the use of SPM techniques in current research and industry are given. Finally, an overview of other SPM techniques is given. The course contains several laboratory exercises.

Entry requirements

Mathematics, 45 ECTS credits, and Physics, 60 ECTS credits, including the courses Quantum Physics I, 7.5 ECTS credits, and Solid State Physics, 7.5 ECTS credits, and upper secondary level English 6, or equivalent

Education offerings

Each offering has its own dates and conditions. Closed offerings are retained as history and do not mean that a new application is open.

Source and updates

Skolverket Susa-navet

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Publication version: 8e217193-f5fa-4778-b085-a4521fd03e8d

Checksum: 1b0dc54c0fc8a359f83ba9dc8f9d468479ce432de4c03bce3b8b33dd67fe3f6c

Last changed according to the source: 2026-03-03T14:13:58